Versatile approach for frequency resolved wavefront characterization

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Proceedings titleSPIE - International Society for Optical Engineering. Proceedings
ConferenceFrontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI, 23 January 2011 through 26 January 2011, San Francisco, CA
Article number79250U
SubjectAttosecond pulse; Beam characteristics; Beam properties; Characterization techniques; Coherent radiation; Diffractograms; Electromagnetic radiation; High harmonic generation; High harmonics; Laser experiments; Molecular levels; Optical reconstruction; Oscillator amplifier; Physical process; Quantum properties; Spatial characterization; Spectral region; Temporal profile; wavefront sensing; X-ray free electron lasers; Xuv radiation; Diffraction patterns; Electromagnetic waves; Electron optics; Free electron lasers; Harmonic analysis; Harmonic generation; Industrial applications; Interferometry; Lasers; Wavefronts
AbstractSpatial characterization of high harmonics (HH) and XUV coherent radiation is of paramount importance, along with its temporal characterization. For many applications it will be necessary to accurately measure the beam properties, just as it is important to know the beam characteristics for many laser experiments. For example, high harmonics and attosecond pulses are being proposed as a front-end for the next generation X-ray free electron lasers. This oscillator-amplifier-like arrangement will require well characterized high harmonic sources. On the other hand, the electromagnetic radiation carries the combined signature of underlying quantum physical processes at the molecular level and of the cooperative phase matching. For example, accurate reconstruction of the high harmonic spatial wavefront, along with its temporal profile, gives us a complete range of tools to apply to the fundamental quantum properties and dynamics associated with high harmonic generation. We present a new concept of frequency resolved wavefront characterization that is particularly suitable for characterizing XUV radiation. In keeping with tradition in the area we give it an acronym - SWORD (Spectral Wavefront Optical Reconstruction by Diffraction). Our approach is based on an analysis of the diffraction pattern of a slit situated in front of a flat-field spectrometer. As the slit is scanned, the spectrally resolved diffraction pattern is recorded. Analyzing the measured diffractogram, we can reconstruct the wavefront. The technique can be easily extended beyond the XUV spectral region. When combined with temporal characterization techniques all information about the beam can be measured. © 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).
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AffiliationNational Research Council Canada
Peer reviewedYes
NPARC number21276166
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Record identifier4646dfa6-c8fd-4da9-a6af-fbe47f82e702
Record created2015-09-28
Record modified2017-04-24
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