Cell to aperture interaction in Patch-Clamp Chips visualized by Fluorescence microscopy and Focused-Ion Beam sections

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DOIResolve DOI: https://doi.org/10.1002/bit.23127
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
  2. National Research Council of Canada. NRC Institute for Biological Sciences
FormatText, Article
Subjection channels; planar patch-clamp chip; gigaseal; fluorescence microscopy; focused ion beam; scanning electron microscopy
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LanguageEnglish
Peer reviewedYes
NPARC number18074298
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Record identifier460ff7b3-d06c-495d-9314-2f2adc0684b7
Record created2011-06-23
Record modified2020-04-21
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