| DOI | Resolve DOI: https://doi.org/10.1557/opl.2011.300 |
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| Author | Search for: Modi, Nikhil; Search for: Tsybeskov, Leonid; Search for: Lockwood, David J.1; Search for: Wu, Xiao Z.2; Search for: Baribeau, Jean Marc2 |
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| Affiliation | - National Research Council of Canada. Measurement Science and Standards
- National Research Council of Canada. Information and Communication Technologies
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| Format | Text, Article |
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| Conference | 2010 MRS Fall Meeting, 29 November 2010 through 3 December 2010, Boston, MA |
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| Subject | Analytical electron microscopy; Excitation wavelength; Interface recombination; Low temperature photoluminescence; PL lifetime; PL quantum efficiency; PL spectra; Si/SiGe; Strain engineering; Strained Silicon; Three-dimensional nanostructures; Time-resolved PL measurement; Ultrahigh resolution; Electron microscopy; Germanium; Semiconductor quantum wells; Nanostructures |
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| Abstract | Strain engineering in composition-controlled Si-Si/Ge nanocluster multilayers with high germanium content (∼ 50%) is achieved by varying thicknesses of Si/SiGe layers and studied by low temperature photoluminescence (PL) measurements. The PL spectra show reduction in strained silicon energy bandgap and a splitting presumably associated with partial removal of heavy hole-light hole degeneracy in SiGe valence band. Time-resolved PL measurements performed under different excitation wavelengths show dramatically different PL lifetimes, ranging from ∼ 2 μs to 10 ns and an unusually high PL quantum efficiency. The results are explained by using the Si/SiGe interface recombination model, which is supported by ultra-high resolution transmission and analytical electron microscopy measurements. © 2011 Materials Research Society. |
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| Publication date | 2011 |
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| Series | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21271549 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 446f7bb7-f43f-435c-afd7-da28d680e547 |
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| Record created | 2014-03-24 |
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| Record modified | 2020-04-21 |
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