Misfit dislocation injection, interfacial stability and photonic properties of Si-Ge strained layers

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1007/BF00125882
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  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
  2. National Research Council of Canada. NRC Institute for National Measurement Standards
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LanguageEnglish
NPARC number12338546
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Record identifier3d997d96-0a70-43fe-8b60-e5dbb494e798
Record created2009-09-10
Record modified2020-04-29
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