Electrical conduction in sputtered Si:Al films

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/0038-1098(83)90498-2
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LanguageEnglish
NRC numberNRC-INMS-2461
NPARC number8899043
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Record identifier325102b9-213f-4293-b596-6ef2f22ddec3
Record created2009-04-22
Record modified2020-03-13
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