Polarized neutron reflectometry study of thin Fe films prepared on V (1?0?0)

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DOIResolve DOI: http://doi.org/10.1016/j.physb.2004.03.056
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Journal titlePhysica. B, Condensed matter
Issue1-3, Supplement 1
SubjectMagnetization; Polarized neutron reflectometry; Thin films; X-ray reflectometry
AbstractThe magnetic properties of ultrathin Fe (1?0?0) films were investigated by polarized neutron reflectometry (PNR). Fe films with different thicknesses from 1 to 3?nm were prepared by Molecular Beam Epitaxy (MBE) on a V buffer layer, which was deposited on a MgO (1?0?0) single crystal. In order to avoid oxidation the Fe films were covered with V capping layers. During the preparation process the growth of the films was monitored by low-energy electron diffraction (LEED) and Auger electron spectroscopy (AES). Combining the information obtained from PNR with X-ray reflectometry (XRR), the thicknesses of the Fe and V layers were determined precisely. From PNR measurements the absolute value of the magnetization of the films could be determined by fitting the spin-up and spin-down neutron reflectivities separately. The magnetic moments of the Fe films show a perfect linear dependence on the film thickness tFe. The fitting line intersects the abscissa at tFe=(0.1?0.01)?nm. This means that the magnetic properties of the two V/Fe interfaces show up as a constant reduction of the magnetic moment equal to an Fe bulk layer of thickness tFe=(0.1?0.01)?nm.
Publication date
AffiliationNational Research Council Canada; NRC Canadian Neutron Beam Centre
Peer reviewedNo
NPARC number12328880
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Record identifier2d742608-d113-4a7f-835b-37093c604750
Record created2009-09-10
Record modified2016-05-09
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