| DOI | Resolve DOI: https://doi.org/10.1063/1.111081 |
|---|
| Author | Search for: Aers, G. C.1 |
|---|
| Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
|
|---|
| Format | Text, Article |
|---|
| Subject | algorithms; backscattering; crystal defects; data analysis; depth profiles; interfaces; monte carlo method; multilayers; positron probes; scaling laws; scattering theory; stopping power |
|---|
| Abstract | Using a simple model to take into account the backscattering effects of interfaces we have developed a scheme which removes the necessity for time-consuming Monte Carlo calculations in the generation of positron stopping profiles in multilayer systems. This scheme uses tabulated mean depth and backscattering fraction data for positrons in the materials constituting the multilayer and represents a computation time saving of several orders of magnitude. This makes detailed multilayer defect profiling with positrons a practical possibility. |
|---|
| Publication date | 1994-01-31 |
|---|
| In | |
|---|
| Language | English |
|---|
| NPARC number | 12328818 |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | 1172e6b7-c683-4b70-9362-118869adb9df |
|---|
| Record created | 2009-09-10 |
|---|
| Record modified | 2020-04-27 |
|---|
