Developments in metrology in support of nanotechnology

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Proceedings titleNanotechnology in Construction 3
Conference3rd International Symposium on Nanotechnology in Construction (NICOM 3), May 31 to June 2, 2009, Prague, Czech Republic
Pages7180; # of pages: 9
Subjectnanotechnology; metrological; scanning-probe; calibration; nanoscale
AbstractNanotechnology emerges out of fundamental science through capability for accurate, repeatable and reproducible measurements on the nanoscale which allows scientists and engineers to accumulate knowledge. Understanding the measurement science is the first step towards development of new ideas. This paper describes some research initiatives which underpin the development of nanotechnology. Programs underway at the National Research Council of Canada include: development of metrological scanning-probe microscope instrumentation for dimensional calibration, materials characterization, development of artefacts designed specifically for dimensional calibration, investigation of metrology for application to soft materials and investigation of intrinsic length standards for realization of the SI metre at the nanoscale.
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AffiliationNational Research Council Canada (NRC-CNRC); NRC Institute for National Measurement Standards; NRC Institute for Microstructural Sciences; NRC Steacie Institute for Molecular Sciences; National Institute for Nanotechnology
Peer reviewedYes
NPARC number16080385
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Record identifier0e08f96b-a000-4710-a4d8-5d8ce8b679ef
Record created2010-09-21
Record modified2016-05-09
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