Applications of high-field asymmetric waveform ion mobility spectrometry for the certification of reference materials
Applications of high-field asymmetric waveform ion mobility spectrometry for the certification of reference materials
Author | Search for: ; Search for: ORCID identifier: https://orcid.org/0000-0002-2377-2615; Search for: |
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Sponsor | Search for: NCSL International; Search for: NCSLI |
Format | Text, Article |
Conference | NCSL International 2006 Workshop and Symposium : metrology's impact on society : conference proceedings, August 6-10, 2006, Nashville, Tennessee, USA |
Physical description | 9 p. |
Language | English |
Peer reviewed | Yes |
NRC number | NRC-INMS-3773 |
NPARC number | 8899634 |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | 0c0cdf11-d751-47d6-aeef-4d6870870004 |
Record created | 2009-04-22 |
Record modified | 2020-04-16 |
- Date modified: