Interfacial Layer Formation in Gd2O3 Films Deposited Directly on Si(0 0 1)

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/S0169-4332(01)00014-9
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  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
  2. National Research Council of Canada. NRC Institute for National Measurement Standards
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NPARC number12744214
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Record identifier09672c18-8c5e-4b5f-8e35-8c31528a8d91
Record created2009-10-27
Record modified2020-03-27
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